カジ旅銀行入金

International Affairs Students Current Students Alumni Faculty/Staff Careers--> TOHOKU UNIVERSITYCREATING GLOBAL EXCELLENCE Search 日本語 Contact Tohoku University --> --> About Facts & Figures Facilities Organization Chart History President's Message Top Global University Project Designated National University Global Network Promotional Videos Academics Undergraduate Graduate Courses in English Exchange Programs Summer Programs Double Degree Programs Academic Calendar Syllabus Admissions Undergraduate Admissions Graduate Admissions Fees and Expenses Financial Aid Research Feature Highlights Research Releases University Research News Research Institutes Visitor Research Center Research Profiles Academic Research Staff Campus Life International Support Office IT Services Facilities Dining & Shops Campus Bus Clubs & Circles News University News Research--> Arts & Culture Health & Sports Campus & Community Press Release--> International Visit Alumni Careers Events Exhibits Music Special Event Lecture Alumni--> Map & Directions Campus Maps & Bus--> Facilities Map--> TOHOKUUNIVERSITY About Academics Admissions Research Campus Life News Events International Affairs Students Current Students Alumni Faculty/Staff Promotional Videos Subscribe to our Newsletter Map & Directions Contact Jobs & Vacancies Emergency Information Site Map 日本語 Close Home News Research CIES and Advantest Develop STT-MRAM Switching Current Measurement for Memory Test Systems News CIES and Advantest Develop STT-MRAM Switching Current Measurement for Memory Test Systems 2018-11-02 Research Tohoku University's Center for Innovative Integrated Electronic Systems (CIES), led by Professor Tetsuo Endoh (Graduate School of Engineering at Tohoku University) has announced success on a collaboration between CIES and semiconductor test equipment supplier Advantest Corporation. The joint research team has developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM), a highly-anticipated next-generation memory technology, in units of microamperes and nanoseconds, using an Advantest memory test system. Memory test system and test environment. Ⓒ Advantest Corporation This makes it possible to observe minute changes in the currents that flow through STT-MRAM memory cells, and represents a great stride toward STT-MRAM failure analysis and the practical application of STT-MRAM technology. This testing technology is available for not only STT-MRAM but also other resistance change type memory such as ReRAM and PCRAM. Tohoku University CIES will continue research and development activities with the aim of commercializing a new STT-MRAM memory test system equipped with an external magnetic field application mechanism. The research is sponsored by the CIES Consortium, and the Program on Open Innovation Platform with Enterprises, Research Institute and Academia (OPERA*). Results were presented at the IEEE Non-volatile Memory Technology Symposium held in Sendai from 22 to 24 October, 2018. *OPERA is a program aimed at the formation of a platform for industrial-academic collaborations. Members include Tohoku University, Kyoto University, Yamagata University, and a group of advanced companies. Tohoku University acts as the coordinator of the program. News in Japanese Contact: Yasunobu MizomotoDirector, Strategic Planning DivisionTohoku UniversityCenter for Innovative Integrated Electronic SystemsEmail: y-mizomocies.tohoku.ac.jp Category University News Research Arts & Culture Health & Sports Campus & Community International Visits Alumni Careers COVID-19 Archives 2014&＃24180; 2015&＃24180; 2016&＃24180; 2017&＃24180; 2018&＃24180; 2019&＃24180; 2020&＃24180; 2021&＃24180; 2022&＃24180; 2023&＃24180; 2024&＃24180; Recent News 2024-04-10 University News Tohoku University&＃039;s New President Meets the Media 2024-04-10 Careers Recruitment Notice: Associate Professor 2024-04-03 University News Tohoku University Entrance Ceremony, Spring 2024 2024-04-02 Careers Recruitment Notice: Assistant Professor 2024-04-01 University News In Conversation with Hideo Ohno Archives Page Top About Tohoku University Academics Admissions Research Campus Life News Events International Affairs Students Alumni Promotional Videos Subscribe to our Newsletter Map & Directions Contact Tohoku University Jobs & Vacancies Emergency Information Site Map Privacy Policy Media Enquiries Parent & Family Support Public Facilities Contact Tohoku University